M. Sc. Florian Schade
- Exam Date: June 10, 2024
- Thesis topic: "Hypervisor-based partitioning of mixed-criticality applications in heterogeneous embedded systems"
- Group: Prof. Becker
- florian schade ∂does-not-exist.kit edu
Corrector: Prof. Dr.-Ing. Jürgen Fleischer (wbk Institut für Produktionstechnik, KIT)

Hypervisor-Based Software Architectures for Efficient Mixed-Criticality Systems
Increasingly powerful processing platforms are leading to centralized control architectures in networked embedded systems, such as those found in cars, airplanes, or industrial production systems. Software-controlled functions that were previously implemented on distributed processing units are now being integrated onto a small number of high-performance machines. Hypervisors support this integration by administering the machine’s resources and isolating applications. In the context of safety-critical and real-time systems, however, the efficient integration of mixed-criticality software is challenging. Therefore, we are researching architectures and mechanisms to increase the efficiency of such platforms while maintaining safety and timing guarantees.

Data Processing in Future Industrial Production Systems
Future industrial production systems present new challenges in data processing and machine control. With a focus on flexibility and efficiency, KIT is investigating a production system concept based on collaborative robots that perform various manufacturing steps. During production, the robots swap out their tools and switch between standalone and collaboration modes. An efficient control and data processing system is required to coordinate the execution of the control and data processing software across a network of processing units, to provide processing power according to the production system’s needs, and to ensure real-time processing when necessary.
Student Projects I Have Supervised (Selection)
- MA: “Architecture for the Integration of Reconfigurable Hardware Accelerators in Hypervisor-Based Edge Devices”
- BA: “Development of a Resource Management Module for XEN Hypervisor Guest System Management”
- BA: “Automated Job Deployment for Reconfigurable Industry 4.0 Production Systems in Additive Manufacturing”
- MA: “Embedded Hypervisor Monitoring Using CPU Trace Information”
- BA: “Design of a Monitoring System for Hypervisor-Based Multiprocessor SoCs”
Publications
Karle, C.; Fuerst-Walter, I.; Schade, F.; Hoefer, J.; Lesniak, F.; Harbaum, T.; Becker, J.
2025. 2025 IEEE 4th German Education Conference (GECon), Hamburg, 21st-23rd July 2025, 1–5, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/GECon64629.2025.11369364
Schade, F.
2024, July 23. Karlsruher Institut für Technologie (KIT). doi:10.5445/IR/1000172536
Mühlbeier, E.; Bauer, V.; Schade, F.; Gönnheimer, P.; Becker, J.; Fleischer, J.
2024. 56th CIRP International Conference on Manufacturing Systems 2023 Hrsg.: Mpofu, Khumbulani; Sacks, Natasha; Damm, Oliver, 120, 744–749. doi:10.1016/j.procir.2023.09.069
Dörr, T.; Schade, F.; Becker, J.; Keramidas, G.; Petrellis, N.; Kelefouras, V.; Mavropoulos, M.; Antonopoulos, K.; Antonopoulos, C. P.; Voros, N.; Ahlbrecht, A.; Zaeske, W.; Janson, V.; Nöldeke, P.; Durak, U.; Panagiotou, C.; Karadimas, D.; Adler, N.; Reichmann, C.; Sailer, A.; et al.
2024. Design, Automation & Test in Europe Conference & Exhibition (DATE), Valencia, Spain, 25-27 March 2024, Institute of Electrical and Electronics Engineers (IEEE). doi:10.23919/DATE58400.2024.10546852
Schade, F.; Dörr, T.; Ahlbrecht, A.; Janson, V.; Durak, U.; Becker, J.
2024. 2023 26th Euromicro Conference on Digital System Design (DSD), Golem, 6th - 8th September 2023, 436 – 443, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/DSD60849.2023.00067
Schade, F.; Kreutzer, M.; Mühlbeier, E.; Gerlitz, E.; Gönnheimer, P.; Fleischer, J.; Becker, J.
2023. Procedia CIRP, 120, 601–606. doi:10.1016/j.procir.2023.09.045
Lüntzel, V.; Schade, F.; Sommer, M.; Sax, E.
2023. Human Interaction and Emerging Technologies (IHIET 2023) : Artificial Intelligence and Future Applications. Ed.: T. Ahram, AHFE International. doi:10.54941/ahfe1004092
Dörr, T.; Schade, F.; Becker, J.
2023. Computer Safety, Reliability, and Security. Ed.: J. Guiochet, 181–195, Springer Nature Switzerland. doi:10.1007/978-3-031-40923-3_14
Dörr, T.; Schade, F.; Ahlbrecht, A.
2023, June 7. 4th Summer School on Cyber-Physical Systems and Internet-of-Things (CPS&IoT 2023), Budva, Montenegro, June 6–10, 2023
Schade, F.; Karle, C.; Mühlbeier, E.; Gönnheimer, P.; Fleischer, J.; Becker, J.
2022. Procedia CIRP, 107, 1311–1316. doi:10.1016/j.procir.2022.05.150
Dörr, T.; Schade, F.; Masing, L.; Becker, J.; Keramidas, G.; Antonopoulos, C. P.; Mavropoulos, M.; Kelefouras, V.; Voros, N.
2022. 2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), Nicosia, Cyprus, 04-06 July 2022, 369–370, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ISVLSI54635.2022.00081
Dörr, T.; Schade, F.; Ahlbrecht, A.; Zaeske, W.; Masing, L.; Durak, U.; Becker, J.
2022. 2022 IEEE/ACM 26th International Symposium on Distributed Simulation and Real Time Applications (DS-RT), 151–159, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/DS-RT55542.2022.9932069
Schade, F.; Sandmann, T.; Becker, J.; Theiling, H.
2022. 2022 IEEE 28th International Conference on Embedded and Real-Time Computing Systems and Applications (RTCSA), Taipei, Taiwan, 23-25 August 2022, 228–234, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/RTCSA55878.2022.00031
Schade, F.; Dörr, T.; Becker, J.
2022. Conference Proceedings: 2022 IEEE 35th International System-on-Chip Conference (SOCC) Ed.: S. Sezer, 1–2, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/SOCC56010.2022.9908090
Siddiqui, F.; Khan, R.; Sezer, S.; McLaughlin, K.; Masing, L.; Dörr, T.; Schade, F.; Becker, J.; Ahlbrecht, A.; Zaeske, W.; Durak, U.; Adler, N.; Sailer, A.; Weber, R.; Wilhelm, T.; Nemeth, G.; Nemeth, G.; Morales, V.; Gomez, P.; Keramidas, G.; et al.
2022. 2022 IEEE 95th Vehicular Technology Conference: (VTC2022-Spring): Proceedings ; 19–22 June 2022, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/VTC2022-Spring54318.2022.9860859
Masing, L.; Dörr, T.; Schade, F.; Becker, J.; Keramidas, G.; Antonopoulos, C. P.; Mavropoulos, M.; Tiganourias, E.; Kelefouras, V.; Antonopoulos, K.; Voros, N.; Durak, U.; Ahlbrecht, A.; Zaeske, W.; Panagiotou, C.; Karadimas, D.; Adler, N.; Sailer, A.; Weber, R.; Wilhelm, T.; et al.
2022. 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE), Antwerp, Belgium, 14-23 March 2022, 814–818, Institute of Electrical and Electronics Engineers (IEEE). doi:10.23919/DATE54114.2022.9774534
Albers, A.; Ovtcharova, J.; Becker, J.; Lanza, G.; Zhang, W.; Zhang, T.; Qiao, F.; Ma, Y.; Wang, J.; Wu, Z.; Ehrmann, C.; Gönnheimer, P.; Behrendt, M.; Mandel, C.; Stürmlinger, T.; Klippert, M.; Kimmig, A.; Schade, F.; Yang, S.; Heider, I.; et al.
2022. (J. Fleischer, Ed.), Karlsruher Institut für Technologie (KIT). doi:10.5445/IR/1000143693
Kimmig, A.; Schöck, M.; Mühlbeier, E.; Oexle, F.; Fleischer, J.; Bönsch, J.; Ovtcharova, J.; Hahn, J.; Grunwald, A.; Albers, A.; Rapp, S.; Hagenmeyer, V.; Scholz, S. G.; Schmidt, A.; Müller, T.; Becker, J.; Schade, F.; Beyerer, J.; Rehak, J.; Zwick, T.; et al.
2021. Zeitschrift für wirtschaftlichen Fabrikbetrieb, 116 (12), 935–939. doi:10.1515/zwf-2021-0207
Becker, J.; Masing, L.; Dörr, T.; Schade, F.; Keramidas, G.; Antonopoulos, C. P.; Mavropoulos, M.; Tiganourias, E.; Kelefouras, V.; Antonopoulos, K.; Voros, N.; Durak, U.; Ahlbrecht, A.; Zaeske, W.; Panagiotou, C.; Karadimas, D.; Adler, N.; Sailer, A.; Weber, R.; Wilhelm, T.; et al.
2021. Proceedings 2021 31st International Conference on Field-Programmable Logic and Applications: FPL 2021 ; Dresden, Germany, 30 August – 3 September 2021, 382–383, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/FPL53798.2021.00075
Schade, F.; Barton, D.; Fleischer, J.; Becker, J.
2021. 7th IEEE World Forum on Internet of Things (WF-IoT), 680–685, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/WF-IoT51360.2021.9595534
Gönnheimer, P.; Kimmig, A.; Mandel, C.; Stürmlinger, T.; Yang, S.; Schade, F.; Ehrmann, C.; Klee, B.; Behrendt, M.; Schlechtendahl, J.; Fischer, M.; Trautmann, K.; Fleischer, J.; Lanza, G.; Ovtcharova, J.; Becker, J.; Albers, A.
2019. Procedia CIRP, 84, 880–885. doi:10.1016/j.procir.2019.04.260
Yigui, L.; Youteng, S.; Schade, F.; Hotfilter, T.; Becker, J.; Yuan, Z.; Zizhou, O.; Weiming, L.
2019. Proceedings of the Institution of Mechanical Engineers / D, 233 (9), 2371–2378. doi:10.1177/0954407019851334
Barton, D.; Gönnheimer, P.; Schade, F.; Ehrmann, C.; Becker, J.; Fleischer, J.
2019. Procedia CIRP, 81, 1331–1336. doi:10.1016/j.procir.2019.04.022
Dörr, T.; Sandmann, T.; Schade, F.; Bapp, F. K.; Becker, J.
2019. Applied Reconfigurable Computing – 15th International Symposium, ARC 2019, Darmstadt, 9.-11. April 2019, 96–111, Springer. doi:10.1007/978-3-030-17227-5_8
Silitonga, A.; Schade, F.; Jiang, G.; Becker, J.
2018. Proceedings of the 16th IEEE International Symposium on Parallel and Distributed Processing with Applications (ISPA2018), Melbourne, Australia, 11th-13th December 2018, 1009–1016, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/BDCloud.2018.00147
Bapp, F. K.; Dörr, T.; Sandmann, T.; Schade, F.; Becker, J.
2018. SAE International. doi:10.4271/2018-01-1072